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Published date: 18 September 2024
Open opportunity - This means that the contract is currently active, and the buying department is looking for potential suppliers to fulfil the contract.
Laboratory, optical and precision equipments (excl. glasses) - 38000000
TW11 0LW
£0 to £65,000
tender_465458/1405967
18 September 2024
9 October 2024
3pm
31 October 2024
9 October 2025
Supply contract
Competitive quotation (below threshold)
The buyer selects a group of potential suppliers to invite to tender.
This procedure can be used for procurements below the relevant contract value threshold.
Yes
No
NPL requires a stylus profilometer to measure the sputter crater depth for X-ray Photoelectron spectroscopy and secondary ion mass spectrometry metrology work. Sputter craters are typically in the range of (1000 µm x 1000 µm) to (100 µm x 100 µm) and with depths from 10 µm to 100 nm. The sample often has high reflectivity (e.g. silver thin film or silicon wafer) and so a stylus profilometer rather than an optical profilometer is required.
Detailed specifications are provided in section 2.2 and 2.3. In addition to these, high quality profiles will be deemed to have the least spurious spikes or ripples. The capability for automation and a 3D scan is preferred.
Links
Additional text
The Authority is using the LUPC Bravo e-tender portal to conduct the procurement process. All Bidders must register their company via the LUPC Bravo Portal. This can be done via the following link https://lupc.bravosolution.co.uk/web/login.shtml
Follow the instructions given in the description or the more information section.
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